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Adding the ability to calibrate the probe against a conductive tab

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This commit is contained in:
Lars Brubaker 2021-02-15 17:30:18 -08:00
parent 824823ded9
commit 1f09ea58b1
8 changed files with 317 additions and 94 deletions
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4
MatterControl.Printing/Settings/PrinterSettings.cs
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@ -137,6 +137,9 @@ namespace MatterHackers.MatterControl.SlicerConfiguration
SettingsKey.has_sd_card_reader,
SettingsKey.has_z_probe,
SettingsKey.has_z_servo,
SettingsKey.has_conductive_nozzle,
SettingsKey.measure_probe_offset_conductively,
SettingsKey.conductive_pad_position,
SettingsKey.heat_extruder_before_homing,
SettingsKey.inactive_cool_down,
SettingsKey.include_firmware_updater,
@ -166,7 +169,6 @@ namespace MatterHackers.MatterControl.SlicerConfiguration
SettingsKey.printer_name,
SettingsKey.probe_has_been_calibrated,
SettingsKey.probe_offset,
SettingsKey.probe_offset_sample_point,
SettingsKey.progress_reporting,
SettingsKey.read_regex,
SettingsKey.recover_first_layer_speed,